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DOI will be assigned to every published paper at no additional charge. 📢 Call for Papers — Volume 13, Issue 9 (September 2026) | Submission Deadline: September 30, 2026 | Rapid peer review: 2–3 days | Impact Factor: 7.37 (SJIF 2026)

Paper Details

📄 IJAERD-OJS-6478

Selected morphological, Structural and Optical properties of Cu2O thin films at elevated annealing temperatures

Author(s):K.P.Ganesan, N.Anandhan, T.Marimuthu, R.Paneerselvam, I.Joseph Paneerdos
Institution:Department of Physics, SaivaBhanu Kshatriya College, Aruppukottai-626101,India
Published In:Vol. 5, Issue 19 — January 2018
Page No.:-
Domain:Engineering
Type:Research Paper
ISSN (Online):2348-4470
ISSN (Print):2348-6406
Abstract

Cuprous oxide (Cu2O) thin films were prepared on to FTO glass substrate by electrodepositionmethod atoptimized bath temperature 60°C and then annealed at varying temperatures of 200°C and 300°C for 1hr each. Thestructural, morphological,optical and vibrational properties of Cu2O thin films were studied using X-ray diffraction(XRD), Scanning electron microscopy (SEM),UV-Visible and Micro Raman spectrometry.X-ray diffraction patternsrevealed that the deposited films were cubic structure with predominant orientation of (111) crystallographical latticeplane and the crystallinityof the film has improved at an annealed temperature 300°C. Since that, the crystallite size (D),dislocation density (δ) and stacking fault probability (α) for preferential orientations are calculated and discussed indetail.SEM micrographs revealed high densed nanoparticle facets of truncated cubes which are more essential forfabricating thin film solar cells.Optical properties of Cu2O films were analyzed by transmittance spectra using UV-Vis-NIRwavelength region. Raman spectra showed that the vibrational peak centered at 637cm-1attributes the formation of Cu2Oin as-prepared and annealed thin films.

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🕮 How to Cite

K.P.Ganesan, N.Anandhan, T.Marimuthu, R.Paneerselvam, I.Joseph Paneerdos, “Selected morphological, Structural and Optical properties of Cu2O thin films at elevated annealing temperatures”, International Journal of Advance Engineering and Research Development (IJAERD), Vol. 5, Issue 19, pp. -, January 2018.

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Vol. 13 | Issue 9
September 2026