SYNTHESIS AND CHARACTERISATION OF ANTIMONY TELLURIDE AND TIN TELLURIDE THIN FILM
| Author(s) | : | V.Rajendran, S.Sivakami, R.Dhanalakshmi, R.Vijayalakshmi |
| Institution | : | Department of Physics, Vivekananda College, Madurai 625234, India |
| Published In | : | Vol. 5, Issue 19 — January 2018 |
| Page No. | : | - |
| Domain | : | Engineering |
| Type | : | Research Paper |
| ISSN (Online) | : | 2348-4470 |
| ISSN (Print) | : | 2348-6406 |
Antimony Telluride and Tin Telluride films were successfully deposited on glass substrate under optimizedcondition by spin coating technique. The films were uniform and had well adherence to the substrate without any pores.As the annealing temperature increases, the orientation of the crystallites was more randomized than in the as preparedfilm. The structural, optical and morphological properties of the film were investigated by XRD, UV-Visible PL andSEM. The XRD pattern indicates that this film was crystallized in the structure.
V.Rajendran, S.Sivakami, R.Dhanalakshmi, R.Vijayalakshmi, “SYNTHESIS AND CHARACTERISATION OF ANTIMONY TELLURIDE AND TIN TELLURIDE THIN FILM”, International Journal of Advance Engineering and Research Development (IJAERD), Vol. 5, Issue 19, pp. -, January 2018.
